Zhiyuan, He, Peng, Zebo, Eles, Petru, Rosinger, Paul and Al-Hashimi, Bashir M. (2006) Thermal-aware SoC test scheduling with test set partitioning and interleaving. ”, International Symposium on Defect and Fault Tolerance in VLSI System, Washington DC. 03 - 04 Oct 2006.
Record type:
Conference or Workshop Item
(Paper)
More information
Published date: 2006
Additional Information:
Event Dates: 3-4 October 2006
Venue - Dates:
”, International Symposium on Defect and Fault Tolerance in VLSI System, Washington DC, 2006-10-03 - 2006-10-04
Keywords:
SoC test, thermal-aware
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 262882
URI: http://eprints.soton.ac.uk/id/eprint/262882
PURE UUID: 822a171b-88e3-4875-b223-ee1c0ed93599
Catalogue record
Date deposited: 04 Aug 2006
Last modified: 14 Mar 2024 07:19
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Contributors
Author:
He Zhiyuan
Author:
Zebo Peng
Author:
Petru Eles
Author:
Paul Rosinger
Author:
Bashir M. Al-Hashimi
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