An Automated System for Contact Lens Inspection
An Automated System for Contact Lens Inspection
This paper describes a novel method for the industrial inspection of ophthalmic contact lenses in a time constrained production line environment. We discuss the background to this problem, look at previous solutions and relevant allied work before describing our system. An overview of the system is given together with detailed descriptions of the algorithms used to perform the image processing, classification and inspection system. We conclude with a preliminary assessment of the system performance and discuss future work needed to complete the system.
industrial inspection, machine vision, probabilistic methods
141-150
Bazin, Alex I.
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Cole, Trevor
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Kett, Brian
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Nixon, Mark S.
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Bebis, George
e1678d60-c648-4298-9144-f72de8b4d5df
2006
Bazin, Alex I.
feead1f3-0fc6-4a1e-b089-f62361614633
Cole, Trevor
5d7a1e62-1c71-4b07-acdd-652f08f153d4
Kett, Brian
2794ca26-e0a1-4a0d-a734-c8f2d2f111df
Nixon, Mark S.
2b5b9804-5a81-462a-82e6-92ee5fa74e12
Bebis, George
e1678d60-c648-4298-9144-f72de8b4d5df
Bazin, Alex I., Cole, Trevor, Kett, Brian and Nixon, Mark S.
(2006)
An Automated System for Contact Lens Inspection.
Bebis, George
(ed.)
2nd International Symposium on Visual Computing, Lake Tahoe, Nevada, United States.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
This paper describes a novel method for the industrial inspection of ophthalmic contact lenses in a time constrained production line environment. We discuss the background to this problem, look at previous solutions and relevant allied work before describing our system. An overview of the system is given together with detailed descriptions of the algorithms used to perform the image processing, classification and inspection system. We conclude with a preliminary assessment of the system performance and discuss future work needed to complete the system.
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More information
Published date: 2006
Additional Information:
Event Dates: 6-8th November 2006
Venue - Dates:
2nd International Symposium on Visual Computing, Lake Tahoe, Nevada, United States, 2006-11-08
Keywords:
industrial inspection, machine vision, probabilistic methods
Organisations:
Southampton Wireless Group
Identifiers
Local EPrints ID: 262990
URI: http://eprints.soton.ac.uk/id/eprint/262990
PURE UUID: 30cffd95-2974-4a7a-ac5f-9178073c8d86
Catalogue record
Date deposited: 19 Sep 2006
Last modified: 09 Jan 2022 02:33
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Contributors
Author:
Alex I. Bazin
Author:
Trevor Cole
Author:
Brian Kett
Editor:
George Bebis
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