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An Automated System for Contact Lens Inspection

An Automated System for Contact Lens Inspection
An Automated System for Contact Lens Inspection
This paper describes a novel method for the industrial inspection of ophthalmic contact lenses in a time constrained production line environment. We discuss the background to this problem, look at previous solutions and relevant allied work before describing our system. An overview of the system is given together with detailed descriptions of the algorithms used to perform the image processing, classification and inspection system. We conclude with a preliminary assessment of the system performance and discuss future work needed to complete the system.
industrial inspection, machine vision, probabilistic methods
141-150
Bazin, Alex I.
feead1f3-0fc6-4a1e-b089-f62361614633
Cole, Trevor
5d7a1e62-1c71-4b07-acdd-652f08f153d4
Kett, Brian
2794ca26-e0a1-4a0d-a734-c8f2d2f111df
Nixon, Mark S.
2b5b9804-5a81-462a-82e6-92ee5fa74e12
Bebis, George
e1678d60-c648-4298-9144-f72de8b4d5df
Bazin, Alex I.
feead1f3-0fc6-4a1e-b089-f62361614633
Cole, Trevor
5d7a1e62-1c71-4b07-acdd-652f08f153d4
Kett, Brian
2794ca26-e0a1-4a0d-a734-c8f2d2f111df
Nixon, Mark S.
2b5b9804-5a81-462a-82e6-92ee5fa74e12
Bebis, George
e1678d60-c648-4298-9144-f72de8b4d5df

Bazin, Alex I., Cole, Trevor, Kett, Brian and Nixon, Mark S. (2006) An Automated System for Contact Lens Inspection. Bebis, George (ed.) 2nd International Symposium on Visual Computing, United States. pp. 141-150 .

Record type: Conference or Workshop Item (Paper)

Abstract

This paper describes a novel method for the industrial inspection of ophthalmic contact lenses in a time constrained production line environment. We discuss the background to this problem, look at previous solutions and relevant allied work before describing our system. An overview of the system is given together with detailed descriptions of the algorithms used to perform the image processing, classification and inspection system. We conclude with a preliminary assessment of the system performance and discuss future work needed to complete the system.

Full text not available from this repository.

More information

Published date: 2006
Additional Information: Event Dates: 6-8th November 2006
Venue - Dates: 2nd International Symposium on Visual Computing, United States, 2006-11-08
Keywords: industrial inspection, machine vision, probabilistic methods
Organisations: Southampton Wireless Group

Identifiers

Local EPrints ID: 262990
URI: https://eprints.soton.ac.uk/id/eprint/262990
PURE UUID: 30cffd95-2974-4a7a-ac5f-9178073c8d86
ORCID for Mark S. Nixon: ORCID iD orcid.org/0000-0002-9174-5934

Catalogue record

Date deposited: 19 Sep 2006
Last modified: 06 Jun 2018 13:17

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