Vaughan, A S, Chen, G, Lewin, P L, Dodd, S J and Swingler, S G (2006) Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes. IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, Savoy Place, London, United Kingdom. 25 - 26 Oct 2006. pp. 29-32 .
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Published date: 2006
Additional Information:
Event Dates: 25-26 October 2006
Venue - Dates:
IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, Savoy Place, London, United Kingdom, 2006-10-25 - 2006-10-26
Organisations:
Electronics & Computer Science, EEE
Identifiers
Local EPrints ID: 263228
URI: http://eprints.soton.ac.uk/id/eprint/263228
ISBN: 0-86341-695-0
PURE UUID: 5af9459f-4eed-4de4-831e-3f0ef011a1a2
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Date deposited: 05 Dec 2006
Last modified: 15 Mar 2024 03:05
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Contributors
Author:
A S Vaughan
Author:
G Chen
Author:
P L Lewin
Author:
S J Dodd
Author:
S G Swingler
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