Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.


Vaughan, A S, Chen, G, Lewin, P L, Dodd, S J and Swingler, S G (2006) Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes. At IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, United Kingdom. 25 - 26 Oct 2006. , pp. 29-32.

Download

[img] PDF IET_Dielectric_Ageing.pdf - Other
Restricted to Registered users only

Download (667kB)
Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 25-26 October 2006
Venue - Dates: IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, United Kingdom, 2006-10-25 - 2006-10-26
Organisations: Electronics & Computer Science, EEE
ePrint ID: 263228
Date :
Date Event
2006Published
Date Deposited: 05 Dec 2006
Last Modified: 17 Apr 2017 21:28
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/263228

Actions (login required)

View Item View Item