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Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.

Vaughan, A S, Chen, G, Lewin, P L, Dodd, S J and Swingler, S G (2006) Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes. At IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, United Kingdom. 25 - 26 Oct 2006. , pp. 29-32.

Record type: Conference or Workshop Item (Paper)
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More information

Published date: 2006
Additional Information: Event Dates: 25-26 October 2006
Venue - Dates: IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, United Kingdom, 2006-10-25 - 2006-10-26
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 263228
URI: http://eprints.soton.ac.uk/id/eprint/263228
ISBN: 0-86341-695-0
PURE UUID: 5af9459f-4eed-4de4-831e-3f0ef011a1a2

Catalogue record

Date deposited: 05 Dec 2006
Last modified: 18 Jul 2017 08:42

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Contributors

Author: A S Vaughan
Author: G Chen
Author: P L Lewin
Author: S J Dodd
Author: S G Swingler

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