Zhang, Zhuo, Reddy, Sudhakar M., Pomeranz, Irith, Rajski, Janusz and Al-Hashimi, Bashir M. (2007) Enhancing delay fault coverage through low power segmented scan. IEE Proceedings: Computer and Digital Techniques.
Record type:
Article
More information
Published date: July 2007
Keywords:
Low-power test, segmented scan, delay fault
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 263315
URI: http://eprints.soton.ac.uk/id/eprint/263315
PURE UUID: 36ec8db6-abc6-4c9e-99c6-042dbc9dbb66
Catalogue record
Date deposited: 15 Jan 2007
Last modified: 14 Mar 2024 07:29
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Contributors
Author:
Zhuo Zhang
Author:
Sudhakar M. Reddy
Author:
Irith Pomeranz
Author:
Janusz Rajski
Author:
Bashir M. Al-Hashimi
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