March CRF: an Efficient Test for Complex Read Faults in SRAM Memories
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories
In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved in the read operation are studied, underlining the causes of the realistic faults concerning this operation. The requirements to cover these fault models are given. We show that the different causes of read failure are independent and may coexist in nanoscale SRAMs, summing their effects and provoking Complex Read Faults, CRFs. We show that the test methodology to cover this new read faults consists in test patterns that match the requirements to cover all the different simple read fault models. We propose a low complexity (?2N) test, March CRF, that covers effectively all the realistic Complex Read Faults
SRAM, Nanoscale Technologies, Read Operation, Realistic Faults, Complex Read Faults, March test
Dilillo, L
680c29f5-4a78-45c0-9823-e25b486e9f6c
Al-Hashimi, B M
0b29c671-a6d2-459c-af68-c4614dce3b5d
2007
Dilillo, L
680c29f5-4a78-45c0-9823-e25b486e9f6c
Al-Hashimi, B M
0b29c671-a6d2-459c-af68-c4614dce3b5d
Dilillo, L and Al-Hashimi, B M
(2007)
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories.
X Workshop on Design and Diagnostics of Electronic Circuits and Systems, Krakow, Poland.
11 - 13 Apr 2007.
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Conference or Workshop Item
(Paper)
Abstract
In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved in the read operation are studied, underlining the causes of the realistic faults concerning this operation. The requirements to cover these fault models are given. We show that the different causes of read failure are independent and may coexist in nanoscale SRAMs, summing their effects and provoking Complex Read Faults, CRFs. We show that the test methodology to cover this new read faults consists in test patterns that match the requirements to cover all the different simple read fault models. We propose a low complexity (?2N) test, March CRF, that covers effectively all the realistic Complex Read Faults
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Published date: 2007
Additional Information:
Event Dates: April 11th – 13th, 2007
Venue - Dates:
X Workshop on Design and Diagnostics of Electronic Circuits and Systems, Krakow, Poland, 2007-04-11 - 2007-04-13
Keywords:
SRAM, Nanoscale Technologies, Read Operation, Realistic Faults, Complex Read Faults, March test
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 263615
URI: http://eprints.soton.ac.uk/id/eprint/263615
PURE UUID: 33f88c14-09ed-4860-8401-534a8e4f37ec
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Date deposited: 26 Feb 2007
Last modified: 14 Mar 2024 07:35
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Contributors
Author:
L Dilillo
Author:
B M Al-Hashimi
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