Vaughan, A.S., Dodd, S.J. and Sutton, S.J. (2003) Electrical treeing in polyethylene: analysis by confocal Raman microprobe spectroscopy. 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, NM, United States. 19 - 22 Oct 2003. pp. 534-537 .
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Published date: October 2003
Additional Information:
Event Dates: 19-22 October 2003 Organisation: IEEE Dielectrics and Insulation Society
Venue - Dates:
2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, NM, United States, 2003-10-19 - 2003-10-22
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 263667
URI: http://eprints.soton.ac.uk/id/eprint/263667
ISBN: 0-7803-7910-1
PURE UUID: 4f4c1978-7c74-4c99-b44f-556944066233
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Date deposited: 07 Mar 2007
Last modified: 15 Mar 2024 03:05
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Contributors
Author:
A.S. Vaughan
Author:
S.J. Dodd
Author:
S.J. Sutton
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