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Three-Dimensional System-in-Package Using Stacked Silicon Platform Technology

Three-Dimensional System-in-Package Using Stacked Silicon Platform Technology
Three-Dimensional System-in-Package Using Stacked Silicon Platform Technology
In this paper, a novel method of fabricating three– dimensional (3-D) system-in-package (SiP) using a silicon carrier that can integrate known good dice with an integrated cooling solution is presented. The backbone of this stacked module is the fabrication of a silicon carrier with through-hole conductive interconnects. The design, process, and assembly to fabricate silicon through-hole interconnect using a wet silicon etching method is discussed in this paper. The process optimization to fabricate silicon carriers with solder through-hole interconnect within the design tolerance has been achieved. The design and modeling methodology to optimize the package in terms of electrical aspects of the stacked module is carried out to achieve less interconnect parasitics. An integrated cooling solution for 3-D stacked modules using single-phase and two-phase cooling solutions is also demonstrated for high-power applications. Known good thin flip-chip devices with daisy chain are fabricated and attached to the silicon carrier by flip-chip processes making it a known good carrier after electrical testing. Individual known good carriers are vertically integrated to form 3-D SiP
Three-dimensional system-in-package (3-D SiP), stacked modules, through wafer interconnection, wafer thinning, integrated cooling solution.
1521-3323
377-386
Kripesh, Vaidyanathan
bd1a19b9-b37f-407d-9310-067736ece2de
Yoon, Seung Wook
2ce14f84-079d-4143-87e2-884f962c334b
Ganesh, V. P.
9354278d-b34b-4880-926b-c883b15c51e5
Khan, Navas
ac4e0fe0-5c7c-404a-9b91-ccb3d815fdee
Rotaru, Mihai D
c53c5038-2fed-4ace-8fad-9f95d4c95b7e
Fang, Wang
6031ae96-aaa3-47fb-a7e0-0878559481ed
Iyer, Mahadevan
c3d63173-2236-4774-89fb-a82594ddc6ed
Kripesh, Vaidyanathan
bd1a19b9-b37f-407d-9310-067736ece2de
Yoon, Seung Wook
2ce14f84-079d-4143-87e2-884f962c334b
Ganesh, V. P.
9354278d-b34b-4880-926b-c883b15c51e5
Khan, Navas
ac4e0fe0-5c7c-404a-9b91-ccb3d815fdee
Rotaru, Mihai D
c53c5038-2fed-4ace-8fad-9f95d4c95b7e
Fang, Wang
6031ae96-aaa3-47fb-a7e0-0878559481ed
Iyer, Mahadevan
c3d63173-2236-4774-89fb-a82594ddc6ed

Kripesh, Vaidyanathan, Yoon, Seung Wook, Ganesh, V. P., Khan, Navas, Rotaru, Mihai D, Fang, Wang and Iyer, Mahadevan (2005) Three-Dimensional System-in-Package Using Stacked Silicon Platform Technology. IEEE Transactions on Advanced Packaging, 28 (3), 377-386.

Record type: Article

Abstract

In this paper, a novel method of fabricating three– dimensional (3-D) system-in-package (SiP) using a silicon carrier that can integrate known good dice with an integrated cooling solution is presented. The backbone of this stacked module is the fabrication of a silicon carrier with through-hole conductive interconnects. The design, process, and assembly to fabricate silicon through-hole interconnect using a wet silicon etching method is discussed in this paper. The process optimization to fabricate silicon carriers with solder through-hole interconnect within the design tolerance has been achieved. The design and modeling methodology to optimize the package in terms of electrical aspects of the stacked module is carried out to achieve less interconnect parasitics. An integrated cooling solution for 3-D stacked modules using single-phase and two-phase cooling solutions is also demonstrated for high-power applications. Known good thin flip-chip devices with daisy chain are fabricated and attached to the silicon carrier by flip-chip processes making it a known good carrier after electrical testing. Individual known good carriers are vertically integrated to form 3-D SiP

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More information

Published date: August 2005
Keywords: Three-dimensional system-in-package (3-D SiP), stacked modules, through wafer interconnection, wafer thinning, integrated cooling solution.
Organisations: EEE

Identifiers

Local EPrints ID: 264157
URI: http://eprints.soton.ac.uk/id/eprint/264157
ISSN: 1521-3323
PURE UUID: 0f6e8e32-82da-450d-9f5d-f508d3e7cc9c

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Date deposited: 11 Jun 2007
Last modified: 14 Mar 2024 07:43

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Contributors

Author: Vaidyanathan Kripesh
Author: Seung Wook Yoon
Author: V. P. Ganesh
Author: Navas Khan
Author: Mihai D Rotaru
Author: Wang Fang
Author: Mahadevan Iyer

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