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Simulation of Electroluminescence using a Bipolar Recombination Model

Simulation of Electroluminescence using a Bipolar Recombination Model
Simulation of Electroluminescence using a Bipolar Recombination Model
A dynamic bipolar charge recombination model originally developed to explain charge injection and electroluminescent (EL) behaviour of pin-plane polymeric resin samples under ac stress has been adapted to allow the simulation of EL from polyethylene films sandwiched in a plane-plane electrode system. The model is described and obtained results compared with experimental measurements. Comparison reveals that there is good agreement between the model and experimental data, indicating that under ac stress and in this case EL may be entirely due to charge injection and bipolar recombination.
1-4244-0750-8
15-18
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Dodd, S J
13f7eab0-eb74-4e89-83c6-555480aba185
Mohd Ariffin, A
0e5c8057-80b5-4659-a2e1-3f94c01b4cea
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Dodd, S J
13f7eab0-eb74-4e89-83c6-555480aba185
Mohd Ariffin, A
0e5c8057-80b5-4659-a2e1-3f94c01b4cea

Lewin, P L, Dodd, S J and Mohd Ariffin, A (2007) Simulation of Electroluminescence using a Bipolar Recombination Model. 9th IEEE International Conference on Solid Dielectrics, Winchester, Winchester, United Kingdom. 08 - 13 Jul 2007. pp. 15-18 .

Record type: Conference or Workshop Item (Paper)

Abstract

A dynamic bipolar charge recombination model originally developed to explain charge injection and electroluminescent (EL) behaviour of pin-plane polymeric resin samples under ac stress has been adapted to allow the simulation of EL from polyethylene films sandwiched in a plane-plane electrode system. The model is described and obtained results compared with experimental measurements. Comparison reveals that there is good agreement between the model and experimental data, indicating that under ac stress and in this case EL may be entirely due to charge injection and bipolar recombination.

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More information

Published date: 2007
Additional Information: Event Dates: 8 - 13 July 2007
Venue - Dates: 9th IEEE International Conference on Solid Dielectrics, Winchester, Winchester, United Kingdom, 2007-07-08 - 2007-07-13
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 264252
URI: http://eprints.soton.ac.uk/id/eprint/264252
ISBN: 1-4244-0750-8
PURE UUID: c72798f5-caff-4cf5-ac79-1f0360870f88
ORCID for P L Lewin: ORCID iD orcid.org/0000-0002-3299-2556

Catalogue record

Date deposited: 03 Jul 2007
Last modified: 15 Mar 2024 02:43

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Contributors

Author: P L Lewin ORCID iD
Author: S J Dodd
Author: A Mohd Ariffin

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