Long range diffusion noise in platinum microwires with metallic adhesion layers
Long range diffusion noise in platinum microwires with metallic adhesion layers
Voltage fluctuations of platinum wires hosted by silicon nitride beams were investigated. The authors considered four variants of the wires: three with an adhesion layer and one without an adhesion layer. They found that the presence of an adhesion layer changes the nature of the power spectrum which is 1/f for wires with no adhesion layers and 1/f3/2 for wires with an adhesion layer. They attribute the value of the exponent α = 3/2 found in wires with adhesion layers to the long range diffusion of oxygen atoms along the interface between the adhesion layer and the platinum layer.
233506
Moktadir, Zakaria
34472668-ffda-4287-8fea-2c4f3bf1e2fa
van Honschoten, Joost W.
7d8a611d-29b1-4da6-ac4b-1641a4bb6ea2
Elwenspoek, Miko
3df8937a-7088-4940-9771-0dd31ff4eda7
2007
Moktadir, Zakaria
34472668-ffda-4287-8fea-2c4f3bf1e2fa
van Honschoten, Joost W.
7d8a611d-29b1-4da6-ac4b-1641a4bb6ea2
Elwenspoek, Miko
3df8937a-7088-4940-9771-0dd31ff4eda7
Moktadir, Zakaria, van Honschoten, Joost W. and Elwenspoek, Miko
(2007)
Long range diffusion noise in platinum microwires with metallic adhesion layers.
Applied Physics Letters, (90), .
Abstract
Voltage fluctuations of platinum wires hosted by silicon nitride beams were investigated. The authors considered four variants of the wires: three with an adhesion layer and one without an adhesion layer. They found that the presence of an adhesion layer changes the nature of the power spectrum which is 1/f for wires with no adhesion layers and 1/f3/2 for wires with an adhesion layer. They attribute the value of the exponent α = 3/2 found in wires with adhesion layers to the long range diffusion of oxygen atoms along the interface between the adhesion layer and the platinum layer.
More information
Published date: 2007
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 264506
URI: http://eprints.soton.ac.uk/id/eprint/264506
ISSN: 0003-6951
PURE UUID: a2243541-e5b6-4cfb-ac7f-a96ef5cdfcb7
Catalogue record
Date deposited: 14 Sep 2007
Last modified: 14 Mar 2024 07:52
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Contributors
Author:
Zakaria Moktadir
Author:
Joost W. van Honschoten
Author:
Miko Elwenspoek
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