Properties and Performance of High-Purity Thermal Barrier Coatings
Properties and Performance of High-Purity Thermal Barrier Coatings
It was found that the content of impurity oxides in 7YSZ, such as SiO2 and Al2O3, has a significant effect on coating sintering resistance and phase stability of 7YSZ thermal barrier coatings (TBCs). The reduction of impurity content will significantly improve sintering resistance and phase stability of 7YSZ TBCs and thus allow the 7YSZ TBCs to be used at higher temperatures.
impurities, phase stability, plasma-sprayed thermal barrier coatings, sintering, thermal conductivity, thermal cyclic life, young's modulus
Xie, L.
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Dorfman, M.R.
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Cipitria, A.
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Paul, S.
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Golosnoy, I.O.
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Clyne, T.W.
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Marple, B.R.
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Hyland, M.M.
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Lau, Y.-C.
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Li, C.-J.
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Lima, R.C.
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Montavon, G.
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14 May 2007
Xie, L.
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Dorfman, M.R.
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Cipitria, A.
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Paul, S.
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Golosnoy, I.O.
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Clyne, T.W.
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Marple, B.R.
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Hyland, M.M.
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Lau, Y.-C.
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Li, C.-J.
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Lima, R.C.
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Montavon, G.
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Xie, L., Dorfman, M.R., Cipitria, A., Paul, S., Golosnoy, I.O. and Clyne, T.W.
(2007)
Properties and Performance of High-Purity Thermal Barrier Coatings.
Marple, B.R., Hyland, M.M., Lau, Y.-C., Li, C.-J., Lima, R.C. and Montavon, G.
(eds.)
2007 International Thermal Spray Conference, Beijing, China.
14 - 16 May 2007.
Record type:
Conference or Workshop Item
(Paper)
Abstract
It was found that the content of impurity oxides in 7YSZ, such as SiO2 and Al2O3, has a significant effect on coating sintering resistance and phase stability of 7YSZ thermal barrier coatings (TBCs). The reduction of impurity content will significantly improve sintering resistance and phase stability of 7YSZ TBCs and thus allow the 7YSZ TBCs to be used at higher temperatures.
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lx_iog_ITSC_2007.pdf
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More information
Published date: 14 May 2007
Additional Information:
Event Dates: May 14-16, 2007
Venue - Dates:
2007 International Thermal Spray Conference, Beijing, China, 2007-05-14 - 2007-05-16
Keywords:
impurities, phase stability, plasma-sprayed thermal barrier coatings, sintering, thermal conductivity, thermal cyclic life, young's modulus
Organisations:
EEE
Identifiers
Local EPrints ID: 264632
URI: http://eprints.soton.ac.uk/id/eprint/264632
PURE UUID: 8587494d-56b0-444b-909f-06f3c731c85a
Catalogue record
Date deposited: 03 Oct 2007
Last modified: 14 Mar 2024 07:53
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Contributors
Author:
L. Xie
Author:
M.R. Dorfman
Author:
A. Cipitria
Author:
S. Paul
Author:
I.O. Golosnoy
Author:
T.W. Clyne
Editor:
B.R. Marple
Editor:
M.M. Hyland
Editor:
Y.-C. Lau
Editor:
C.-J. Li
Editor:
R.C. Lima
Editor:
G. Montavon
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