The University of Southampton
University of Southampton Institutional Repository

The effect of self-affine fractal roughness of wires on atom chips

Moktadir, Z, Darquie, B, Kraft, M and Hinds, E. A. (2007) The effect of self-affine fractal roughness of wires on atom chips Journal of Modern Optics, (54:13), pp. 2149-2160.

Record type: Article

Abstract

Atom chips use current flowing in lithographically patterned wires to produce microscopic magnetic traps for atoms. The density distribution of a trapped cold atom cloud reveals disorder in the trapping potential, which results from meandering current flow in the wire. Roughness in the edges of the wire is usually the main cause of this behaviour. Here, we point out that the edges of microfabricated wires normally exhibit self-affine roughness. We investigate the consequences of this for disorder in atom traps. In particular, we consider how closely the trap can approach the wire when there is a maximum allowable strength of the disorder. We comment on the role of roughness in future atom–surface interaction experiments.

PDF self_affine_roughness_JMO_(2).pdf - Other
Download (203kB)

More information

Published date: 2007
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 264635
URI: http://eprints.soton.ac.uk/id/eprint/264635
ISSN: 0950-0340
PURE UUID: 361bb662-d65d-44e6-a704-ab81faab8f77

Catalogue record

Date deposited: 04 Oct 2007
Last modified: 18 Jul 2017 07:33

Export record

Contributors

Author: Z Moktadir
Author: B Darquie
Author: M Kraft
Author: E. A. Hinds

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×