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Testing of Level Shifters in Multiple Voltage Designs

Testing of Level Shifters in Multiple Voltage Designs
Testing of Level Shifters in Multiple Voltage Designs
The use of multiple voltages for different cores is becoming a widely accepted technique for efficient power management. Level shifters are used as interfaces between voltage domains. Through extensive transistor level simulations of resistive open, bridging and resistive short faults, we have classified the testing of level shifters into PASSIVE and ACTIVE modes. We examine if high test coverage can be achieved in the PASSIVE mode. We consider resistive opens and shorts and show that, for testing purposes, consideration of purely digital fault effects is sufficient. Thus conventional digital DfT can be employed to test level shifters. In all cases, we conclude that using sets of single supply voltages for testing is sufficient.
Zain Ali, Noohul Basheer
845c9da7-dce4-4965-a7a3-b920e965d82f
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Zain Ali, Noohul Basheer
845c9da7-dce4-4965-a7a3-b920e965d82f
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d

Zain Ali, Noohul Basheer, Zwolinski, Mark and Al-Hashimi, Bashir (2007) Testing of Level Shifters in Multiple Voltage Designs At 14th IEEE International Conference on Electronics, Circuits and Systems, Morocco. 11 - 14 May 2007.

Record type: Conference or Workshop Item (Other)

Abstract

The use of multiple voltages for different cores is becoming a widely accepted technique for efficient power management. Level shifters are used as interfaces between voltage domains. Through extensive transistor level simulations of resistive open, bridging and resistive short faults, we have classified the testing of level shifters into PASSIVE and ACTIVE modes. We examine if high test coverage can be achieved in the PASSIVE mode. We consider resistive opens and shorts and show that, for testing purposes, consideration of purely digital fault effects is sufficient. Thus conventional digital DfT can be employed to test level shifters. In all cases, we conclude that using sets of single supply voltages for testing is sufficient.

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More information

Published date: 11 December 2007
Additional Information: Event Dates: 11-14 May 2007
Venue - Dates: 14th IEEE International Conference on Electronics, Circuits and Systems, Morocco, 2007-05-11 - 2007-05-14
Organisations: Electronic & Software Systems, EEE

Identifiers

Local EPrints ID: 265341
URI: http://eprints.soton.ac.uk/id/eprint/265341
PURE UUID: a8393891-8db0-4bcc-b676-c5ae2800102f
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 28 Mar 2008 10:52
Last modified: 18 Jul 2017 07:27

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Contributors

Author: Noohul Basheer Zain Ali
Author: Mark Zwolinski ORCID iD

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