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Lamellar morphology of random metallocene propylene copolymers studied by atomic force microscopy

Record type: Article

Four sets of propylene based random copolymers with co-units of ethylene, 1-butene, 1-hexene and 1-octene, and a total defect content up to similar to 9 mol% (including co-unit and other defects), were studied after rapid and isothermal crystallization. Etched film surfaces and ultrarnicrotomed plaques were imaged so as to enhance contrast and minimize catalyst and co-catalyst residues. While increasing concentration of structural irregularities breaks down spherulitic habits, the formation of the gamma polymorph has a profound effect on the lamellar morphology. Lamellae grown in the radial axis of the spherulite and branches hereon are replaced in gamma-rich copolymers with a dense array of short lamellae transverse or tilted to the main structural growth axis. This is the expected orientation for gamma iPP branching from a seeds. Spherulites are formed in copolymers with non-crystallizable units ( 1-hexene and 1-octene) up to similar to 3 mol% total defect content and were observed up to similar to 6 mol% in those with partially crystallizable comonorners (ethylene and 1-butene). However, lamellae were observed in all the copolymers analyzed, even in the most defective ones, highlighting the important role of the gamma polymorph in propagating lamellar crystallites in poly(propylenes) with a high concentration of defects. Long periods measured from AFM and SAXS are comparatively analyzed.

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Citation

Hosier, I.L., Alamo, R.G. and Lin, J.S. (2004) Lamellar morphology of random metallocene propylene copolymers studied by atomic force microscopy Polymer, 45, (10), pp. 3441-3455.

More information

Published date: May 2004
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 265717
URI: http://eprints.soton.ac.uk/id/eprint/265717
ISSN: 0032-3861
PURE UUID: c9ab1f74-0524-45c2-b0c1-5a5fe4ad45f4
ORCID for I.L. Hosier: ORCID iD orcid.org/0000-0003-4365-9385

Catalogue record

Date deposited: 15 May 2008 09:47
Last modified: 18 Jul 2017 07:24

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Contributors

Author: I.L. Hosier ORCID iD
Author: R.G. Alamo
Author: J.S. Lin

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