Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models


Li, Weifeng, Feng, Yongfeng, Wilson, Peter, Mantooth, Alan, Santi, Enrico and Hudgins, Jerry (2008) Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models At Grand Challenges on Modeling and Simulation M&S Net.

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Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: June 2008
Venue - Dates: Grand Challenges on Modeling and Simulation M&S Net, 2008-06-01
Organisations: EEE
ePrint ID: 265845
Date :
Date Event
18 June 2008Published
Date Deposited: 18 Jun 2008 22:21
Last Modified: 17 Apr 2017 19:12
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/265845

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