Li, Weifeng, Feng, Yongfeng, Wilson, Peter, Mantooth, Alan, Santi, Enrico and Hudgins, Jerry (2008) Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. SCSC 2008, Edinburgh.
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Conference or Workshop Item
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More information
Published date: 18 June 2008
Additional Information:
Event Dates: June 2008
Venue - Dates:
SCSC 2008, Edinburgh, 2008-05-31
Organisations:
EEE
Identifiers
Local EPrints ID: 265969
URI: http://eprints.soton.ac.uk/id/eprint/265969
PURE UUID: 32185c94-bb9f-4aca-8df3-6ce0a59f90c4
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Date deposited: 18 Jun 2008 22:29
Last modified: 10 Dec 2021 22:03
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Contributors
Author:
Weifeng Li
Author:
Yongfeng Feng
Author:
Peter Wilson
Author:
Alan Mantooth
Author:
Enrico Santi
Author:
Jerry Hudgins
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