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Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

Li, Weifeng, Feng, Yongfeng, Wilson, Peter, Mantooth, Alan, Santi, Enrico and Hudgins, Jerry (2008) Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models At SCSC 2008.

Record type: Conference or Workshop Item (Paper)

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Published date: 18 June 2008
Additional Information: Event Dates: June 2008
Venue - Dates: SCSC 2008, 2008-06-01
Organisations: EEE

Identifiers

Local EPrints ID: 265969
URI: http://eprints.soton.ac.uk/id/eprint/265969
PURE UUID: 32185c94-bb9f-4aca-8df3-6ce0a59f90c4

Catalogue record

Date deposited: 18 Jun 2008 22:29
Last modified: 18 Jul 2017 07:21

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Contributors

Author: Weifeng Li
Author: Yongfeng Feng
Author: Peter Wilson
Author: Alan Mantooth
Author: Enrico Santi
Author: Jerry Hudgins

University divisions

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