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Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models
Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models
Li, Weifeng
e4e7808d-5140-4da1-a60f-03fe2ef38620
Feng, Yongfeng
a00a7f1a-743e-48ee-8de4-dde96ae821cf
Wilson, Peter
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Mantooth, Alan
707b616e-5363-4caf-8389-0df562c09c28
Santi, Enrico
ce28f6dc-3c84-47cb-bc3e-82060e68a0bd
Hudgins, Jerry
e1b4092b-b4ec-458d-9752-a35d2c5e2b13
Li, Weifeng
e4e7808d-5140-4da1-a60f-03fe2ef38620
Feng, Yongfeng
a00a7f1a-743e-48ee-8de4-dde96ae821cf
Wilson, Peter
8a65c092-c197-4f43-b8fc-e12977783cb3
Mantooth, Alan
707b616e-5363-4caf-8389-0df562c09c28
Santi, Enrico
ce28f6dc-3c84-47cb-bc3e-82060e68a0bd
Hudgins, Jerry
e1b4092b-b4ec-458d-9752-a35d2c5e2b13

Li, Weifeng, Feng, Yongfeng, Wilson, Peter, Mantooth, Alan, Santi, Enrico and Hudgins, Jerry (2008) Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. SCSC 2008, Edinburgh.

Record type: Conference or Workshop Item (Paper)

Full text not available from this repository.

More information

Published date: 18 June 2008
Additional Information: Event Dates: June 2008
Venue - Dates: SCSC 2008, Edinburgh, 2008-05-31
Organisations: EEE

Identifiers

Local EPrints ID: 265969
URI: http://eprints.soton.ac.uk/id/eprint/265969
PURE UUID: 32185c94-bb9f-4aca-8df3-6ce0a59f90c4

Catalogue record

Date deposited: 18 Jun 2008 22:29
Last modified: 26 Mar 2020 17:33

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Contributors

Author: Weifeng Li
Author: Yongfeng Feng
Author: Peter Wilson
Author: Alan Mantooth
Author: Enrico Santi
Author: Jerry Hudgins

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