Warren, R and Mills, Rob (2008) Patent: US 7,383,481: Method and apparatus for testing a functional circuit at speed.
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Published date: 3 June 2008
Additional Information:
Patent granted by US Patent office on 3 June 2008
Organisations:
EEE
Identifiers
Local EPrints ID: 265999
URI: http://eprints.soton.ac.uk/id/eprint/265999
PURE UUID: babaadaf-9e94-43ab-9911-61a3824bc9bc
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Date deposited: 26 Jun 2008 00:04
Last modified: 10 Dec 2021 22:04
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Author:
R Warren
Author:
Rob Mills
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