Effective Modeling of Leakage Inductance for use in Circuit Simulation
Effective Modeling of Leakage Inductance for use in Circuit Simulation
Theoretical methods for the calculation of winding losses with respect to frequency have been well documented, but the variation in leakage inductance of magnetic components due to frequency has been less well addressed. In this paper Dowell’s well-known theoretical approach is tested using measurements and finite element analyses. The results presented show deficiencies in the accuracy of models generated using Dowell’s approach and highlight the trade-offs between model complexity, simulation time and accuracy when the finite element analysis method is applied. An alternative behavioural model is presented which models the frequency variation in leakage inductance accurately, is easy to characterize from simple measurements or calculations and is robust.
Wilson, Peter
8a65c092-c197-4f43-b8fc-e12977783cb3
Brown, Andrew
5c19e523-65ec-499b-9e7c-91522017d7e0
February 2008
Wilson, Peter
8a65c092-c197-4f43-b8fc-e12977783cb3
Brown, Andrew
5c19e523-65ec-499b-9e7c-91522017d7e0
Wilson, Peter and Brown, Andrew
(2008)
Effective Modeling of Leakage Inductance for use in Circuit Simulation.
Applied Power Electronics Conference, Austin, Tx, United States.
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Conference or Workshop Item
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Abstract
Theoretical methods for the calculation of winding losses with respect to frequency have been well documented, but the variation in leakage inductance of magnetic components due to frequency has been less well addressed. In this paper Dowell’s well-known theoretical approach is tested using measurements and finite element analyses. The results presented show deficiencies in the accuracy of models generated using Dowell’s approach and highlight the trade-offs between model complexity, simulation time and accuracy when the finite element analysis method is applied. An alternative behavioural model is presented which models the frequency variation in leakage inductance accurately, is easy to characterize from simple measurements or calculations and is robust.
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Published date: February 2008
Venue - Dates:
Applied Power Electronics Conference, Austin, Tx, United States, 2008-02-01
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EEE
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Local EPrints ID: 266049
URI: http://eprints.soton.ac.uk/id/eprint/266049
PURE UUID: 8cb1bcc0-61cd-4208-af0b-b712b318874d
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Date deposited: 04 Jul 2008 07:19
Last modified: 14 Mar 2024 08:19
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Author:
Peter Wilson
Author:
Andrew Brown
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