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Identifying single-electron charging islands in a two-dimensional network of nanocrystalline silicon grains using Coulomb oscillation fingerprints

Identifying single-electron charging islands in a two-dimensional network of nanocrystalline silicon grains using Coulomb oscillation fingerprints
Identifying single-electron charging islands in a two-dimensional network of nanocrystalline silicon grains using Coulomb oscillation fingerprints
1550-235X
35316
Khalafallah, M.
7d5fcce6-ce4b-443a-aba7-85427b0be721
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Durrani, Z. A. K.
193df358-3ef5-4cd9-8f77-359c697e839d
Khalafallah, M.
7d5fcce6-ce4b-443a-aba7-85427b0be721
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Durrani, Z. A. K.
193df358-3ef5-4cd9-8f77-359c697e839d

Khalafallah, M., Mizuta, Hiroshi and Durrani, Z. A. K. (2006) Identifying single-electron charging islands in a two-dimensional network of nanocrystalline silicon grains using Coulomb oscillation fingerprints. Physical Review B, 74, 35316.

Record type: Article
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Published date: 2006
Organisations: Nanoelectronics and Nanotechnology

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Local EPrints ID: 266183
URI: http://eprints.soton.ac.uk/id/eprint/266183
ISSN: 1550-235X
PURE UUID: aee12c98-60a7-4f71-88e4-add5a9998f86

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Date deposited: 21 Jul 2008 15:25
Last modified: 14 Mar 2024 08:22

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Contributors

Author: M. Khalafallah
Author: Hiroshi Mizuta
Author: Z. A. K. Durrani

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