Salem, M. A., Mizuta, Hiroshi, Oda, S., Fu, Y. and Willander, M. (2005) AFM current-imaging study for current density through nanocrystalline silicon dots embedded in SiO2. Japanese Journal of Applied Physics, 44, L88-L91.
Record type:
Article
More information
Published date: 2005
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266195
URI: http://eprints.soton.ac.uk/id/eprint/266195
ISSN: 0021-4922
PURE UUID: 27a52d03-ab3d-46ec-a9ae-2466184ea4aa
Catalogue record
Date deposited: 22 Jul 2008 08:08
Last modified: 14 Mar 2024 08:22
Export record
Contributors
Author:
M. A. Salem
Author:
Hiroshi Mizuta
Author:
S. Oda
Author:
Y. Fu
Author:
M. Willander
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.