Salem, M. A., Mizuta, Hiroshi and Oda, S. (2004) Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy. Applied Physics Letters, 85, 3262-3264.
Record type:
Article
More information
Published date: 2004
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266202
URI: http://eprints.soton.ac.uk/id/eprint/266202
ISSN: 0003-6951
PURE UUID: ac4e4506-46a2-467b-8bf7-0c32bcbb79a1
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Date deposited: 22 Jul 2008 08:13
Last modified: 14 Mar 2024 08:22
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Contributors
Author:
M. A. Salem
Author:
Hiroshi Mizuta
Author:
S. Oda
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