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Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy

Record type: Article
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Citation

Salem, M. A., Mizuta, Hiroshi and Oda, S. (2004) Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy Applied Physics Letters, 85, pp. 3262-3264.

More information

Published date: 2004
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266202
URI: http://eprints.soton.ac.uk/id/eprint/266202
ISSN: 0003-6951
PURE UUID: ac4e4506-46a2-467b-8bf7-0c32bcbb79a1

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Date deposited: 22 Jul 2008 08:13
Last modified: 18 Jul 2017 07:19

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Contributors

Author: M. A. Salem
Author: Hiroshi Mizuta
Author: S. Oda

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