Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy


Salem, M. A., Mizuta, Hiroshi and Oda, S. (2004) Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy Applied Physics Letters, 85, pp. 3262-3264.

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Item Type: Article
ISSNs: 0003-6951 (print)
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266202
Date :
Date Event
2004Published
Date Deposited: 22 Jul 2008 08:13
Last Modified: 17 Apr 2017 19:07
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266202

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