Walker, P., Mizuta, Hiroshi, Uno, S., Furuta, Y. and Hasko, D. (2004) Improved off-current and subthreshold slope in aggressively scaled poly-Si TFTs with a single grain boundary in the channel. IEEE Transactions on Electron Devices, ED-54, 212-218.
Record type:
Article
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Published date: 2004
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266204
URI: http://eprints.soton.ac.uk/id/eprint/266204
PURE UUID: 81d2adf8-9509-43a2-a588-bee60fdb59b8
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Date deposited: 22 Jul 2008 08:20
Last modified: 14 Mar 2024 08:22
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Contributors
Author:
P. Walker
Author:
Hiroshi Mizuta
Author:
S. Uno
Author:
Y. Furuta
Author:
D. Hasko
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