Improved off-current and subthreshold slope in aggressively scaled poly-Si TFTs with a single grain boundary in the channel


Walker, P., Mizuta, Hiroshi, Uno, S., Furuta, Y. and Hasko, D. (2004) Improved off-current and subthreshold slope in aggressively scaled poly-Si TFTs with a single grain boundary in the channel IEEE Transactions on Electron Devices, ED-54, pp. 212-218.

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Item Type: Article
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266204
Date :
Date Event
2004Published
Date Deposited: 22 Jul 2008 08:20
Last Modified: 17 Apr 2017 19:07
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266204

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