Nagami, T., Momo, N., Tsuchiya, Yoshishige, Saito, S., Arai, T., Shimada, T., Mizuta, Hiroshi and Oda, S. (2006) Electro-mechanical simulation of programming / readout characteristics for NEMS memory. IEEE Silicon Nanoelectronics Workshop, Honolulu. pp. 105-106 .
Record type:
Conference or Workshop Item
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Published date: June 2006
Additional Information:
Event Dates: June 2006
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop, Honolulu, 2006-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266302
URI: http://eprints.soton.ac.uk/id/eprint/266302
PURE UUID: 394c17ff-3f79-4aa9-b566-f8b315022dc2
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Date deposited: 23 Jul 2008 10:43
Last modified: 14 Mar 2024 08:26
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Contributors
Author:
T. Nagami
Author:
N. Momo
Author:
Yoshishige Tsuchiya
Author:
S. Saito
Author:
T. Arai
Author:
T. Shimada
Author:
Hiroshi Mizuta
Author:
S. Oda
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