Pr-silicate Ultrathin Films for High-k Gate Dielectrics Prepared by Metal-Organic Chemical Vapor Deposition
Pr-silicate Ultrathin Films for High-k Gate Dielectrics Prepared by Metal-Organic Chemical Vapor Deposition
30
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Fujita, H.
26316f23-b687-4849-875b-3f8180761e1d
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Nohira, H.
79e58176-2227-4989-bf1a-c03f07764e15
Hattori, T.
03686cfe-2164-450c-8a3c-735d1509ac94
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
June 2004
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Fujita, H.
26316f23-b687-4849-875b-3f8180761e1d
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Nohira, H.
79e58176-2227-4989-bf1a-c03f07764e15
Hattori, T.
03686cfe-2164-450c-8a3c-735d1509ac94
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Tsuchiya, Yoshishige, Fujita, H., Mizuta, Hiroshi, Nohira, H., Hattori, T. and Oda, S.
(2004)
Pr-silicate Ultrathin Films for High-k Gate Dielectrics Prepared by Metal-Organic Chemical Vapor Deposition.
2004 TMS Electronic materials conference and exhibition, Notre Dame.
.
Record type:
Conference or Workshop Item
(Poster)
Text
cpaper_087.pdf
- Other
More information
Published date: June 2004
Additional Information:
Event Dates: June 2004
Venue - Dates:
2004 TMS Electronic materials conference and exhibition, Notre Dame, 2004-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266335
URI: http://eprints.soton.ac.uk/id/eprint/266335
PURE UUID: 107c5aa2-cadf-4904-a954-8cf1b2cf1543
Catalogue record
Date deposited: 25 Jul 2008 08:27
Last modified: 14 Mar 2024 08:26
Export record
Contributors
Author:
Yoshishige Tsuchiya
Author:
H. Fujita
Author:
Hiroshi Mizuta
Author:
H. Nohira
Author:
T. Hattori
Author:
S. Oda
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics