Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy. the 2004 International Conference on Solid State Devices and Materials, Tokyo. pp 884-885 .
Record type:
Conference or Workshop Item
(Other)
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Published date: September 2004
Additional Information:
Event Dates: September 2004
Venue - Dates:
the 2004 International Conference on Solid State Devices and Materials, Tokyo, 2004-09-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266338
URI: http://eprints.soton.ac.uk/id/eprint/266338
PURE UUID: a1f021a5-a9d5-4a7d-a3ad-cd1e01b5fed9
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Date deposited: 25 Jul 2008 08:34
Last modified: 14 Mar 2024 08:26
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Contributors
Author:
M. A. Salem
Author:
Yoshishige Tsuchiya
Author:
K. Usami
Author:
Hiroshi Mizuta
Author:
S. Oda
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