Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy


Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy At the 2004 International Conference on Solid State Devices and Materials. , pp 884-885.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Event Dates: September 2004
Venue - Dates: the 2004 International Conference on Solid State Devices and Materials, 2004-09-01
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266338
Date :
Date Event
September 2004Published
Date Deposited: 25 Jul 2008 08:34
Last Modified: 17 Apr 2017 19:04
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266338

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