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Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy

Record type: Conference or Workshop Item (Other)
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Citation

Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy At the 2004 International Conference on Solid State Devices and Materials. , pp 884-885.

More information

Published date: September 2004
Additional Information: Event Dates: September 2004
Venue - Dates: the 2004 International Conference on Solid State Devices and Materials, 2004-09-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266338
URI: http://eprints.soton.ac.uk/id/eprint/266338
PURE UUID: a1f021a5-a9d5-4a7d-a3ad-cd1e01b5fed9

Catalogue record

Date deposited: 25 Jul 2008 08:34
Last modified: 18 Jul 2017 07:17

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Contributors

Author: M. A. Salem
Author: Yoshishige Tsuchiya
Author: K. Usami
Author: Hiroshi Mizuta
Author: S. Oda

University divisions


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