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AFM current imaging for surface oxidized nanocrystalline silicon dots

Salem, M. A., Mizuta, Hiroshi, Oda, S., Fu, Y. and Willander, M. (2004) AFM current imaging for surface oxidized nanocrystalline silicon dots At 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies. , p 241.

Record type: Conference or Workshop Item (Other)
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Published date: June 2004
Additional Information: Event Dates: June 2004
Venue - Dates: 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies, 2004-06-01
Organisations: Nanoelectronics and Nanotechnology

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Local EPrints ID: 266339
URI: http://eprints.soton.ac.uk/id/eprint/266339
PURE UUID: 07c97457-6a0b-47c3-96b1-ad691884bac2

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Date deposited: 25 Jul 2008 08:37
Last modified: 18 Jul 2017 07:17

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Contributors

Author: M. A. Salem
Author: Hiroshi Mizuta
Author: S. Oda
Author: Y. Fu
Author: M. Willander

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