AFM current imaging for surface oxidized nanocrystalline silicon dots


Salem, M. A., Mizuta, Hiroshi, Oda, S., Fu, Y. and Willander, M. (2004) AFM current imaging for surface oxidized nanocrystalline silicon dots At 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies. , p 241.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Event Dates: June 2004
Venue - Dates: 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies, 2004-06-01
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266339
Date :
Date Event
June 2004Published
Date Deposited: 25 Jul 2008 08:37
Last Modified: 17 Apr 2017 19:04
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266339

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