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Intergrain coupling effects on Coulomb oscillations in dual-gated nanocrystalline silicon point-contact transistor

Intergrain coupling effects on Coulomb oscillations in dual-gated nanocrystalline silicon point-contact transistor
Intergrain coupling effects on Coulomb oscillations in dual-gated nanocrystalline silicon point-contact transistor
Khalafalla, M.
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Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Durrani, Z. A. K.
193df358-3ef5-4cd9-8f77-359c697e839d
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Khalafalla, M.
4a320e02-d7bf-4cc0-a5e4-bf818ea565bc
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Durrani, Z. A. K.
193df358-3ef5-4cd9-8f77-359c697e839d
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde

Khalafalla, M., Mizuta, Hiroshi, Durrani, Z. A. K., Ahmed, H. and Oda, S. (2004) Intergrain coupling effects on Coulomb oscillations in dual-gated nanocrystalline silicon point-contact transistor. International Conference on Polycrystalline Semiconductors 2004, Potsdum.

Record type: Conference or Workshop Item (Other)
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More information

Published date: September 2004
Additional Information: Event Dates: September 2004
Venue - Dates: International Conference on Polycrystalline Semiconductors 2004, Potsdum, 2004-09-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266344
URI: http://eprints.soton.ac.uk/id/eprint/266344
PURE UUID: f50e3ec6-6263-4d61-9f85-252421ec4811

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Date deposited: 25 Jul 2008 08:53
Last modified: 14 Mar 2024 08:27

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Contributors

Author: M. Khalafalla
Author: Hiroshi Mizuta
Author: Z. A. K. Durrani
Author: H. Ahmed
Author: S. Oda

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