Uno, S., Mori, N., Nakazato, K., Koshida, N. and Mizuta, Hiroshi (2004) Electron Energy Loss Behavior in Si Quantum Dots Interconnected with Tunnel Oxide Barriers. 2004 Silicon Nanoelectronics Workshop, Honolulu. pp 121-122 .
Record type:
Conference or Workshop Item
(Poster)
More information
Published date: June 2004
Additional Information:
Event Dates: June 2004
Venue - Dates:
2004 Silicon Nanoelectronics Workshop, Honolulu, 2004-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266347
URI: http://eprints.soton.ac.uk/id/eprint/266347
PURE UUID: a738595c-30f0-4d8a-a38b-f06c88a01e2c
Catalogue record
Date deposited: 25 Jul 2008 09:01
Last modified: 14 Mar 2024 08:27
Export record
Contributors
Author:
S. Uno
Author:
N. Mori
Author:
K. Nakazato
Author:
N. Koshida
Author:
Hiroshi Mizuta
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.