Amakawa, S., Nakazato, K. and Mizuta, Hiroshi (2002) A new approach to failure analysis and yield enhancement of very large-scale integrated systems. 32th European Solid-State Device Research Conference, Firenze. pp 147-150 .
Record type:
Conference or Workshop Item
(Other)
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Published date: September 2002
Additional Information:
Event Dates: September 2002
Venue - Dates:
32th European Solid-State Device Research Conference, Firenze, 2002-09-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266378
URI: http://eprints.soton.ac.uk/id/eprint/266378
PURE UUID: e1aee380-17ae-46e1-bc1e-bac1e69484d2
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Date deposited: 28 Jul 2008 08:19
Last modified: 14 Mar 2024 08:28
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Contributors
Author:
S. Amakawa
Author:
K. Nakazato
Author:
Hiroshi Mizuta
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