A new approach to failure analysis and yield enhancement of very large-scale integrated systems


Amakawa, S., Nakazato, K. and Mizuta, Hiroshi (2002) A new approach to failure analysis and yield enhancement of very large-scale integrated systems At 32th European Solid-State Device Research Conference. , pp 147-150.

Download

[img] PDF cpaper_059.pdf - Other
Download (196kB)
Item Type: Conference or Workshop Item (Other)
Additional Information: Event Dates: September 2002
Venue - Dates: 32th European Solid-State Device Research Conference, 2002-09-01
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266378
Date :
Date Event
September 2002Published
Date Deposited: 28 Jul 2008 08:19
Last Modified: 17 Apr 2017 19:03
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266378

Actions (login required)

View Item View Item