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A new approach to failure analysis and yield enhancement of very large-scale integrated systems

Amakawa, S., Nakazato, K. and Mizuta, Hiroshi (2002) A new approach to failure analysis and yield enhancement of very large-scale integrated systems At 32th European Solid-State Device Research Conference. , pp 147-150.

Record type: Conference or Workshop Item (Other)
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Published date: September 2002
Additional Information: Event Dates: September 2002
Venue - Dates: 32th European Solid-State Device Research Conference, 2002-09-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266378
URI: http://eprints.soton.ac.uk/id/eprint/266378
PURE UUID: e1aee380-17ae-46e1-bc1e-bac1e69484d2

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Date deposited: 28 Jul 2008 08:19
Last modified: 18 Jul 2017 07:16

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Contributors

Author: S. Amakawa
Author: K. Nakazato
Author: Hiroshi Mizuta

University divisions

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