Furuta, Y., Mizuta, Hiroshi, Nakazato, K., Kamiya, T., Tan, Y. T., Durrani, Z. A. K. and Taniguchi, K. (2001) Characterization of tunnel-barriers in polycrystalline Si point-contact single-electron transistors. 2001 International Conference on Solid State Devices and Materials, Tokyo.
Record type:
Conference or Workshop Item
(Poster)
More information
Published date: September 2001
Additional Information:
Event Dates: September 2001
Venue - Dates:
2001 International Conference on Solid State Devices and Materials, Tokyo, 2001-09-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266380
URI: http://eprints.soton.ac.uk/id/eprint/266380
PURE UUID: be51f673-6115-4102-bfa2-ace6cbd50532
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Date deposited: 28 Jul 2008 08:25
Last modified: 14 Mar 2024 08:28
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Contributors
Author:
Y. Furuta
Author:
Hiroshi Mizuta
Author:
K. Nakazato
Author:
T. Kamiya
Author:
Y. T. Tan
Author:
Z. A. K. Durrani
Author:
K. Taniguchi
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