Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM
Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM
Salem, M. A.
8d5d6e2b-c597-4642-98e7-74fc7f83ce98
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K.
f506146b-9864-482a-bc61-1de94522d32c
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
June 2004
Salem, M. A.
8d5d6e2b-c597-4642-98e7-74fc7f83ce98
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K.
f506146b-9864-482a-bc61-1de94522d32c
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S.
(2004)
Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM.
16th International Vacuum Congress, Venice.
Record type:
Conference or Workshop Item
(Other)
This record has no associated files available for download.
More information
Published date: June 2004
Additional Information:
Event Dates: June 2004
Venue - Dates:
16th International Vacuum Congress, Venice, 2004-05-31
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266390
URI: http://eprints.soton.ac.uk/id/eprint/266390
PURE UUID: 564da3ae-8e66-4b1e-a1ef-1646161c15c9
Catalogue record
Date deposited: 28 Jul 2008 08:59
Last modified: 10 Dec 2021 22:16
Export record
Contributors
Author:
M. A. Salem
Author:
Yoshishige Tsuchiya
Author:
K. Usami
Author:
Hiroshi Mizuta
Author:
S. Oda
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics