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Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM

Record type: Conference or Workshop Item (Other)

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Citation

Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM At 16th International Vacuum Congress.

More information

Published date: June 2004
Additional Information: Event Dates: June 2004
Venue - Dates: 16th International Vacuum Congress, 2004-06-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266390
URI: http://eprints.soton.ac.uk/id/eprint/266390
PURE UUID: 564da3ae-8e66-4b1e-a1ef-1646161c15c9

Catalogue record

Date deposited: 28 Jul 2008 08:59
Last modified: 18 Jul 2017 07:16

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Contributors

Author: M. A. Salem
Author: Yoshishige Tsuchiya
Author: K. Usami
Author: Hiroshi Mizuta
Author: S. Oda

University divisions


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