Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM


Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM At 16th International Vacuum Congress.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Event Dates: June 2004
Venue - Dates: 16th International Vacuum Congress, 2004-06-01
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266390
Date :
Date Event
June 2004Published
Date Deposited: 28 Jul 2008 08:59
Last Modified: 17 Apr 2017 19:03
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266390

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