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Electron confinement in variable-area resonant tunnelling diodes using in-plane implanted gates

Electron confinement in variable-area resonant tunnelling diodes using in-plane implanted gates
Electron confinement in variable-area resonant tunnelling diodes using in-plane implanted gates
Goodings, C.
41a3c0bd-9b15-4f8c-9d93-7867cbd9723d
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Cleaver, J. R. A.
c552937c-6985-41f4-9454-79be139e1413
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf
Goodings, C.
41a3c0bd-9b15-4f8c-9d93-7867cbd9723d
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Cleaver, J. R. A.
c552937c-6985-41f4-9454-79be139e1413
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf

Goodings, C., Mizuta, Hiroshi, Cleaver, J. R. A. and Ahmed, H. (1993) Electron confinement in variable-area resonant tunnelling diodes using in-plane implanted gates. The 10th International Conference on Electronic Properties of Two-Dimensional Systems.

Record type: Conference or Workshop Item (Other)

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More information

Published date: July 1993
Additional Information: Event Dates: June 1993
Venue - Dates: The 10th International Conference on Electronic Properties of Two-Dimensional Systems, 1993-06-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266429
URI: http://eprints.soton.ac.uk/id/eprint/266429
PURE UUID: 7416d496-cada-499b-ae2b-796200df22f8

Catalogue record

Date deposited: 30 Jul 2008 09:37
Last modified: 13 Dec 2018 10:45

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