Ho, S., Moriyoshi, A., Ohbu, I., Kagaya, O., Mizuta, Hiroshi and Yamaguchi, K. (1993) Theoretical analysis of transconductance enhancement due to electron concentration dependent screening in heavily doped systems. Int. Workshop on VLSI Process and Device Modeling, Nara, Nara.
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Published date: July 1993
Additional Information:
Event Dates: July 1993
Venue - Dates:
Int. Workshop on VLSI Process and Device Modeling, Nara, Nara, 1993-06-30
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266430
URI: http://eprints.soton.ac.uk/id/eprint/266430
PURE UUID: ed948662-acde-48bb-8842-374d7d84f212
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Date deposited: 30 Jul 2008 09:41
Last modified: 10 Dec 2021 22:17
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Contributors
Author:
S. Ho
Author:
A. Moriyoshi
Author:
I. Ohbu
Author:
O. Kagaya
Author:
Hiroshi Mizuta
Author:
K. Yamaguchi
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