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Theoretical analysis of transconductance enhancement due to electron concentration dependent screening in heavily doped systems

Ho, S., Moriyoshi, A., Ohbu, I., Kagaya, O., Mizuta, Hiroshi and Yamaguchi, K. (1993) Theoretical analysis of transconductance enhancement due to electron concentration dependent screening in heavily doped systems At Int. Workshop on VLSI Process and Device Modeling, Nara.

Record type: Conference or Workshop Item (Other)

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More information

Published date: July 1993
Additional Information: Event Dates: July 1993
Venue - Dates: Int. Workshop on VLSI Process and Device Modeling, Nara, 1993-07-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266430
URI: http://eprints.soton.ac.uk/id/eprint/266430
PURE UUID: ed948662-acde-48bb-8842-374d7d84f212

Catalogue record

Date deposited: 30 Jul 2008 09:41
Last modified: 18 Jul 2017 07:16

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Contributors

Author: S. Ho
Author: A. Moriyoshi
Author: I. Ohbu
Author: O. Kagaya
Author: Hiroshi Mizuta
Author: K. Yamaguchi

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