Ho, S., Oohira, M., Kagoya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1993) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. Int. Workshop on VLSI Process and Device Modeling, Nara.
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Published date: July 1993
Additional Information:
Event Dates: July 1993
Venue - Dates:
Int. Workshop on VLSI Process and Device Modeling, Nara, 1993-06-30
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266431
URI: http://eprints.soton.ac.uk/id/eprint/266431
PURE UUID: f8f137be-c6ea-4771-8414-30c09552615a
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Date deposited: 30 Jul 2008 09:45
Last modified: 10 Dec 2021 22:17
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Contributors
Author:
S. Ho
Author:
M. Oohira
Author:
O. Kagoya
Author:
A. Moriyoshi
Author:
Hiroshi Mizuta
Author:
K. Yamaguchi
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