Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs


Ho, S., Oohira, M., Kagoya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1993) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs At Int. Workshop on VLSI Process and Device Modeling.

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Item Type: Conference or Workshop Item (Other)
Additional Information: Event Dates: July 1993
Venue - Dates: Int. Workshop on VLSI Process and Device Modeling, 1993-07-01
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 266431
Date :
Date Event
July 1993Published
Date Deposited: 30 Jul 2008 09:45
Last Modified: 17 Apr 2017 19:03
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266431

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