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Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs

Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs
Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs
Ho, S.
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Oohira, M.
694a9584-ce13-4257-b3e1-fad0a4fa3b5e
Kagoya, O.
27691d97-977c-42ff-8bc8-ae4cbdcafc86
Moriyoshi, A.
6266b774-c4e4-45d7-abb6-6e1ae27b7a24
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Yamaguchi, K.
817d4eee-95a7-41c3-9d6e-18ca2eac715d
Ho, S.
1fea5087-d1be-42e8-b5f7-c4c886f0d825
Oohira, M.
694a9584-ce13-4257-b3e1-fad0a4fa3b5e
Kagoya, O.
27691d97-977c-42ff-8bc8-ae4cbdcafc86
Moriyoshi, A.
6266b774-c4e4-45d7-abb6-6e1ae27b7a24
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Yamaguchi, K.
817d4eee-95a7-41c3-9d6e-18ca2eac715d

Ho, S., Oohira, M., Kagoya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1993) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. Int. Workshop on VLSI Process and Device Modeling.

Record type: Conference or Workshop Item (Other)

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More information

Published date: July 1993
Additional Information: Event Dates: July 1993
Venue - Dates: Int. Workshop on VLSI Process and Device Modeling, 1993-07-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266431
URI: https://eprints.soton.ac.uk/id/eprint/266431
PURE UUID: f8f137be-c6ea-4771-8414-30c09552615a

Catalogue record

Date deposited: 30 Jul 2008 09:45
Last modified: 13 Dec 2018 10:45

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Contributors

Author: S. Ho
Author: M. Oohira
Author: O. Kagoya
Author: A. Moriyoshi
Author: Hiroshi Mizuta
Author: K. Yamaguchi

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