Mizuta, Hiroshi, Tanoue, T. and Takahashi, S. (1989) Theoretical analysis of peak-to-valley ratio degradation caused by scattering processes in multi-barrier resonant tunneling diodes. IEEE/Cornell Conf. on Advanced Concepts in High Speed Semiconductor Devices and Circuits, Ithaca. pp 274-283 .
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Published date: August 1989
Additional Information:
Event Dates: August 1989
Venue - Dates:
IEEE/Cornell Conf. on Advanced Concepts in High Speed Semiconductor Devices and Circuits, Ithaca, 1989-07-31
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266443
URI: http://eprints.soton.ac.uk/id/eprint/266443
PURE UUID: aa6ea923-84e5-47c4-8276-faf17affd869
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Date deposited: 30 Jul 2008 10:11
Last modified: 10 Dec 2021 22:17
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Contributors
Author:
Hiroshi Mizuta
Author:
T. Tanoue
Author:
S. Takahashi
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