Ho, S., Oohira, M., Kagaya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1994) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. IEICE Trans. Electron, E77-C, 187-193.
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Published date: 1994
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266456
URI: http://eprints.soton.ac.uk/id/eprint/266456
PURE UUID: 62dc22a5-7fe5-47b2-9996-773b21819597
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Date deposited: 31 Jul 2008 08:17
Last modified: 10 Dec 2021 22:17
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Contributors
Author:
S. Ho
Author:
M. Oohira
Author:
O. Kagaya
Author:
A. Moriyoshi
Author:
Hiroshi Mizuta
Author:
K. Yamaguchi
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