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Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs

Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs
Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs
187-193
Ho, S.
1fea5087-d1be-42e8-b5f7-c4c886f0d825
Oohira, M.
694a9584-ce13-4257-b3e1-fad0a4fa3b5e
Kagaya, O.
f148d3a3-fc64-4940-96ee-c61b432eddae
Moriyoshi, A.
6266b774-c4e4-45d7-abb6-6e1ae27b7a24
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Yamaguchi, K.
817d4eee-95a7-41c3-9d6e-18ca2eac715d
Ho, S.
1fea5087-d1be-42e8-b5f7-c4c886f0d825
Oohira, M.
694a9584-ce13-4257-b3e1-fad0a4fa3b5e
Kagaya, O.
f148d3a3-fc64-4940-96ee-c61b432eddae
Moriyoshi, A.
6266b774-c4e4-45d7-abb6-6e1ae27b7a24
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Yamaguchi, K.
817d4eee-95a7-41c3-9d6e-18ca2eac715d

Ho, S., Oohira, M., Kagaya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1994) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. IEICE Trans. Electron, E77-C, 187-193.

Record type: Article

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More information

Published date: 1994
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266456
URI: https://eprints.soton.ac.uk/id/eprint/266456
PURE UUID: 62dc22a5-7fe5-47b2-9996-773b21819597

Catalogue record

Date deposited: 31 Jul 2008 08:17
Last modified: 13 Dec 2018 10:45

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