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Control of grains and grain boundaries in nano/polycrystalline silicon for single-electron device applications

Control of grains and grain boundaries in nano/polycrystalline silicon for single-electron device applications
Control of grains and grain boundaries in nano/polycrystalline silicon for single-electron device applications
5-6
Mizuta, Hiroshi
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Furuta, Y.
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Kamiya, T.
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Tan, Y.T.
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Durrani, Z.A.K.
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Uno, S.
ad5d0b8f-4180-46db-b7e8-4d38c4d0bc61
Nakazato, K.
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Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Furuta, Y.
2b3632d6-4ef3-4bce-a686-0e0973b35dcd
Kamiya, T.
d52831ff-3dba-4d58-abd2-55958ebade6e
Tan, Y.T.
59875338-af31-4fd6-9277-cc328791a4ef
Durrani, Z.A.K.
193df358-3ef5-4cd9-8f77-359c697e839d
Uno, S.
ad5d0b8f-4180-46db-b7e8-4d38c4d0bc61
Nakazato, K.
b12e41d3-3527-48ed-9ecd-b38f774ba838

Mizuta, Hiroshi, Furuta, Y., Kamiya, T., Tan, Y.T., Durrani, Z.A.K., Uno, S. and Nakazato, K. (2002) Control of grains and grain boundaries in nano/polycrystalline silicon for single-electron device applications. CREST FEMD Newsletter, 4 (3), 5-6.

Record type: Article

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More information

Published date: 2002
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266477
URI: http://eprints.soton.ac.uk/id/eprint/266477
PURE UUID: 4ce2d55f-9445-4bab-8e7a-d7b1d55a2482

Catalogue record

Date deposited: 01 Aug 2008 12:01
Last modified: 10 Dec 2021 22:17

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Contributors

Author: Hiroshi Mizuta
Author: Y. Furuta
Author: T. Kamiya
Author: Y.T. Tan
Author: Z.A.K. Durrani
Author: S. Uno
Author: K. Nakazato

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