Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM
Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM
Salem, M.A.
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Tsuchiya, Yoshishige
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Usami, K.
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Mizuta, Hiroshi
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Oda, S.
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2004
Salem, M.A.
71641e94-d72b-4f45-9a72-8ea3ca2c54c9
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K.
f506146b-9864-482a-bc61-1de94522d32c
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Salem, M.A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S.
(2004)
Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM.
CREST FEMD Newsletter, 5 (4).
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Published date: 2004
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266480
URI: http://eprints.soton.ac.uk/id/eprint/266480
PURE UUID: a2baf9ca-2bf5-4f32-8409-061090ab6685
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Date deposited: 01 Aug 2008 12:10
Last modified: 10 Dec 2021 22:17
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Contributors
Author:
M.A. Salem
Author:
Yoshishige Tsuchiya
Author:
K. Usami
Author:
Hiroshi Mizuta
Author:
S. Oda
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