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Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM

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Citation

Salem, M.A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM CREST FEMD News Letter, 5, (4)

More information

Published date: 2004
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266480
URI: http://eprints.soton.ac.uk/id/eprint/266480
PURE UUID: a2baf9ca-2bf5-4f32-8409-061090ab6685

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Date deposited: 01 Aug 2008 12:10
Last modified: 18 Jul 2017 07:16

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Contributors

Author: M.A. Salem
Author: Yoshishige Tsuchiya
Author: K. Usami
Author: Hiroshi Mizuta
Author: S. Oda

University divisions

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