The University of Southampton
University of Southampton Institutional Repository

Measuring particle-substrate distance with Surface Plasmon Resonance Microscopy

Measuring particle-substrate distance with Surface Plasmon Resonance Microscopy
Measuring particle-substrate distance with Surface Plasmon Resonance Microscopy
Because of its high sensitivity, surface plasmon resonance (SPR) has been used to measure the optical properties of thin films. Surface plasmon resonance microscopy (SPRM) has been developed as a tool to image the two-dimensional architecture of thin films. The method can be used as a non-invasive tool for imaging cells on a surface. In this paper SPRM has been used to image latex spheres immobilized on a gold surface. We show that it is possible to calculate the distance between the sphere and the surface in two dimensions by capturing an image at one fixed angle. This technique obviates the need for the traditional angle-scanning system. We show how a map of the particle-substrate gap can be reconstructed directly from a single SPR intensity image. Such a technique could be applied to measure the contact distance between a living cell and a substrate in real time.
1741-3567
333-337
Zhang, T
17c33ebe-f357-454a-96ec-466295603d08
Morgan, Hywel
de00d59f-a5a2-48c4-a99a-1d5dd7854174
Riehle, M
95877242-24a6-4387-bd43-c38d554398cc
Curtis, A
81d5122c-2e83-45bc-b7c7-fc9cfcb03aae
Zhang, T
17c33ebe-f357-454a-96ec-466295603d08
Morgan, Hywel
de00d59f-a5a2-48c4-a99a-1d5dd7854174
Riehle, M
95877242-24a6-4387-bd43-c38d554398cc
Curtis, A
81d5122c-2e83-45bc-b7c7-fc9cfcb03aae

Zhang, T, Morgan, Hywel, Riehle, M and Curtis, A (2001) Measuring particle-substrate distance with Surface Plasmon Resonance Microscopy. Journal of Optics A: Pure and Applied Optics, 3 (5), 333-337. (doi:10.1088/1464-4258/3/5/304).

Record type: Article

Abstract

Because of its high sensitivity, surface plasmon resonance (SPR) has been used to measure the optical properties of thin films. Surface plasmon resonance microscopy (SPRM) has been developed as a tool to image the two-dimensional architecture of thin films. The method can be used as a non-invasive tool for imaging cells on a surface. In this paper SPRM has been used to image latex spheres immobilized on a gold surface. We show that it is possible to calculate the distance between the sphere and the surface in two dimensions by capturing an image at one fixed angle. This technique obviates the need for the traditional angle-scanning system. We show how a map of the particle-substrate gap can be reconstructed directly from a single SPR intensity image. Such a technique could be applied to measure the contact distance between a living cell and a substrate in real time.

Full text not available from this repository.

More information

Published date: September 2001
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266497
URI: https://eprints.soton.ac.uk/id/eprint/266497
ISSN: 1741-3567
PURE UUID: 2e2786dd-d73a-4a8f-b57f-01342589c50a
ORCID for Hywel Morgan: ORCID iD orcid.org/0000-0003-4850-5676

Catalogue record

Date deposited: 04 Aug 2008 00:16
Last modified: 20 Jul 2019 00:59

Export record

Altmetrics

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of https://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×