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Yield improvement using configurable analogue transistors (CATs)

Wilson, Peter and Wilcock, Reuben (2008) Yield improvement using configurable analogue transistors (CATs) Electronics Letters, 44, (19), pp. 1132-1134. (doi:10.1049/el:20081409).

Record type: Article

Abstract

Continued process scaling has led to significant yield and reliability challenges for today’s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. This paper describes a new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit

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Published date: 2008
Organisations: EEE

Identifiers

Local EPrints ID: 266667
URI: http://eprints.soton.ac.uk/id/eprint/266667
ISSN: 0013-5194
PURE UUID: 5da47dff-0fce-435d-9033-eff7e6519fad

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Date deposited: 15 Sep 2008 18:41
Last modified: 18 Jul 2017 07:14

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Contributors

Author: Peter Wilson
Author: Reuben Wilcock

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