Yield improvement using configurable analogue transistors (CATs)

Wilson, Peter and Wilcock, Reuben (2008) Yield improvement using configurable analogue transistors (CATs) Electronics Letters, 44, (19), pp. 1132-1134. (doi:10.1049/el:20081409).


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Continued process scaling has led to significant yield and reliability challenges for today’s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. This paper describes a new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit

Item Type: Article
Digital Object Identifier (DOI): doi:10.1049/el:20081409
ISSNs: 0013-5194 (print)
Organisations: EEE
ePrint ID: 266667
Date :
Date Event
Date Deposited: 15 Sep 2008 18:41
Last Modified: 17 Apr 2017 19:00
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266667

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